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Acuros® CQD® 1280 GigE eSWIR Camera
Acuros® CQD® 확장 SWIR(eSWIR) 카메라의 감도는 350nm ~ 2000nm입니다. 이 새로운 광대역 기능은 화학 감지, 감시 영상, 플라스틱 분류, 열 영상 등을 위한 새로운 응용 분야를 열어줍니다. 모든 Acuros 카메라는 GeniCam과 호환되며 합법적인 수출을 위해 라이센스가 필요하지 않기 때문에 EAR-99로 지정됩니다. Acuros 카메라는 경쟁사의 5µm 피치 InGaAs 카메라보다 SNR이 최대 10db 더 높습니다.
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- HD resolution
- TEC cooling
- Low noise
- Fast frame rate
- Visible-eSWIR
- GigE Vision
- EAR-99
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Electro-Optical Specifications:
- Sensor: Acuros® CQD® sensor
- Temperature stabilization: Single-stage thermo-electric cooler
- Sensor array format: 1280 x1024
- Resolution: 1.31 megapixels
- Spectral band: 350 nm - 2000 nm
- Array size: 19.2 mm x 15.4 mm, 24.6 mm diagonal
- Pixel pitch: 15 µm x 15µm
- Max frame rate at full resolution: 88 fps (8 bit), 45 fps (10, 12, 14 bit)
- Pixel operability: 99.9% typical, 99.75% min
- Bit depth: 8, 10, 12, 14 bit selectable
- Integration type: Snapshot global shutter
- Trigger: External TTL
- Integration time: 10 µsec to 4 sec
- Dynamic range: 65 dB typical
- Windowing: Array centered
- Windowing frame rate: Scales inversely with window size
- Binning arrays: 2 x 2, 4 x 4
- Non-uniformity correction: 2-point non-uniformity correction
- Temporal dark noise: 65e- typical (high gain)
- Detectivity: See typical detectivity curve.
- Operating case temperature: -20 °C to +55 °C
- Power consumption: 6.5 - 12 W depending on TEC settings
- Power supply voltage: 6-16 VDC. POE not supported.
- Regulatory compliance: CE mark
- Dimensions excluding lens: 6.1 x 6.1 x 10.3 cm (C-Mount)
- Weight excluding lens: 508 grams with C-mount adaptor, 594g(F-mount)
- Lens mounts: C-Mount, M42 (C-Mount flange-back distance)
- Power connector: Hirose 12-pin, HR10A-10R-12PB (71)
- Trigger connector: BNC
- Software development kit: Windows GUI and Pleora eBUS SDK (Linux, Windows, MacOS)
- GenICam compliance: Yes
- Interface: GigE Vision
- US export designation: EAR-99. No license required for lawful export
- Part numbers: Acuros-1280-GigE-002
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- Hydrocarbon detection
- Chemical sensing
- Medical imaging
- Plastic sorting
- Hyperspectral
- High resolution
- Thermal imaging
- Surveillance
- Machine vision
- Silicon inspection
- Instrumentation